Electromagnetic field mapping at the nanoscale in the transmission electron microscope
Transmission electron microscopy has been revolutionized in recent years, both by the introduction of new hardware such as aberration correctors and by the development of new techniques. In this talk, I will describe how electron microscopy can be used to obtain quantitative information about not only local microstructure and chemistry in materials but also magnetic fields and electrostatic potentials with close-to-atomic spatial resolution. When combined with electron tomography and in situ techniques, this information can be obtained in three dimensions, as a function of temperature and in the presence of applied fields and reactive gases.