Atomic force microscopy of thin films, crystals, and nanoscale electronic structures

Prof. Dr. Andreas Stemmer (D-MAVT)

Atomic force microscopy (AFM) has seen a remarkable development – starting from a kind of small sample scanning profilometer in 1986 it gradually evolved into a non-contact imaging tool capable of visualizing chemical bonds in single molecules today. Yet, such superb resolution is not achieved when imaging organic thin films like 2D-polymers. In my talk I will shed some light on practical aspects and requirements of high-resolution imaging. I will further show how the atomic force microscope allows one to image and analyse electronic properties of active nanoscale structures and how a single AFM tip may substitute for complicated four-point probe measurements.

Overview D-MATL Seminar 2018